Multi-target Composite Magnetron Sputtering Film Deposition Coating System
Model: Lith-PC-JS10-Multi-target, Multi-film Deposition
Specifications
Category
Parameter
Primary Application
Nanoscale monolayer/multilayer films (hard coatings, metals, semiconductors, dielectrics)
Target Users
Universities, research institutes (R&D and small-batch production)
System Composition
Vacuum chamber, sputtering targets, sample stage, vacuum pumps, gas delivery, control systems, film thickness monitor, and auxiliary components
Vacuum Performance
Parameter
Specification
Ultimate Vacuum
6.7 × 10-5 Pa
System Leak Rate
≤1 × 10-7 Pa·L/s
Vacuum Recovery Time
≤40 min (to 6.6 × 10-1 Pa after N2 purge)
Chamber & Sample Stage
Component
Specification
Chamber Dimensions
Ø630 mm × 350 mm (cylindrical)
Sample Capacity
8 × 4-inch substrates (1 mm thickness)
Sputtering Targets
Feature
Specification
Target Types
3 × Permanent magnet targets, 3 × High-intensity magnet targets
Cooling Method
Indirect water-cooled (brazed structure)
Target Diameter
Ø100 mm
Target-Substrate Distance
50–90 mm (manual adjustment, with position indicator)
Sputtering Mode
Vertical downward sputtering
Substrate Control
Parameter
Specification
Bias Voltage
Up to -200 V
Rotation Mechanism
Computer-controlled revolution + rotation (stepper motor-driven)
Temperature Control
RT to 300°C (single calibration required; 3 heaters, one active at a time)
Gas & Thickness Control
Component
Specification
Mass Flow Controllers (MFC)
2 channels
Film Thickness Monitor
Quartz crystal microbalance (0–999,999 Å)
Pumping Options
Configuration
Components
Standard
Turbo molecular pump + dry scroll pump
Alternative
Cryogenic pump + dry scroll pump
Computer Control Features
· Real-time displacement/speed monitoring with error calculation.
· Linear/logarithmic display modes for speed vs. displacement.
· Site-specific deposition via precision positioning.
Key Advantages & Applications
✔ Multi-Target Flexibility – Supports diverse materials (metals, oxides, nitrides).
✔ Uniform Deposition – Computer-controlled rotation ensures film consistency.
✔ High Vacuum Stability – Minimizes contamination for high-purity films.
✔ Research-Ready – Modular design suits optoelectronics, tribological coatings, and semiconductor R&D.
Ideal for: Advanced material science studies and prototyping of functional thin-film devices.
Specifications
|
Category |
Parameter |
|
Primary Application |
Nanoscale monolayer/multilayer films (hard coatings, metals, semiconductors, dielectrics) |
|
Target Users |
Universities, research institutes (R&D and small-batch production) |
|
System Composition |
Vacuum chamber, sputtering targets, sample stage, vacuum pumps, gas delivery, control systems, film thickness monitor, and auxiliary components |
Vacuum Performance
|
Parameter |
Specification |
|
Ultimate Vacuum |
6.7 × 10-5 Pa |
|
System Leak Rate |
≤1 × 10-7 Pa·L/s |
|
Vacuum Recovery Time |
≤40 min (to 6.6 × 10-1 Pa after N2 purge) |
Chamber & Sample Stage
|
Component |
Specification |
|
Chamber Dimensions |
Ø630 mm × 350 mm (cylindrical) |
|
Sample Capacity |
8 × 4-inch substrates (1 mm thickness) |
Sputtering Targets
|
Feature |
Specification |
|
Target Types |
3 × Permanent magnet targets, 3 × High-intensity magnet targets |
|
Cooling Method |
Indirect water-cooled (brazed structure) |
|
Target Diameter |
Ø100 mm |
|
Target-Substrate Distance |
50–90 mm (manual adjustment, with position indicator) |
|
Sputtering Mode |
Vertical downward sputtering |
Substrate Control
|
Parameter |
Specification |
|
Bias Voltage |
Up to -200 V |
|
Rotation Mechanism |
Computer-controlled revolution + rotation (stepper motor-driven) |
|
Temperature Control |
RT to 300°C (single calibration required; 3 heaters, one active at a time) |
Gas & Thickness Control
|
Component |
Specification |
|
Mass Flow Controllers (MFC) |
2 channels |
|
Film Thickness Monitor |
Quartz crystal microbalance (0–999,999 Å) |
Pumping Options
|
Configuration |
Components |
|
Standard |
Turbo molecular pump + dry scroll pump |
|
Alternative |
Cryogenic pump + dry scroll pump |
Computer Control Features
· Real-time displacement/speed monitoring with error calculation.
· Linear/logarithmic display modes for speed vs. displacement.
· Site-specific deposition via precision positioning.
Key Advantages & Applications
✔ Multi-Target Flexibility – Supports diverse materials (metals, oxides, nitrides).
✔ Uniform Deposition – Computer-controlled rotation ensures film consistency.
✔ High Vacuum Stability – Minimizes contamination for high-purity films.
✔ Research-Ready – Modular design suits optoelectronics, tribological coatings, and semiconductor R&D.
Ideal for: Advanced material science studies and prototyping of functional thin-film devices.








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Email : gilia@inthelaboratory.com









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